Professor Takahashi at Tohoku University have utilized NanoTerasu to achieve non-destructive three-dimensional visualization of the interior of CMOS image sensors containing light elements

Professor Takahashi and his team at Tohoku University have successfully utilized the NanoTerasu Coalition Beamline BL10U to non-destructively observe and quantitatively evaluate the three-dimensional structure inside CMOS image sensors at a resolution of approximately 30 nanometers (nm, where 1 nm equals one-billionth of a meter

Non-destructive 3D Visualization of CMOS Image Sensor Interiors Containing Light Elements
— A new frontier in nano-structure analysis enabled by NanoTerasu’s high-brilliance tender X-rays.
[Tohoku University Press Release (Website): Non-destructive 3D Visualization of CMOS Image Sensor Interiors Containing Light Elements]