Sub-10 nm X-ray Imaging Achieved at NanoTerasu – X-ray Ptychography Demonstrates a Resolution of Approximately 7 nm –

A research team led by graduate student Yuhei Sasaki of the Graduate School of Engineering, Tohoku University; Associate Professor Kokoro Ishiguro of the International Center for Synchrotron Radiation Innovation Smart (SRIS), Tohoku University; and Professor Yukio Takahashi of SRIS, Tohoku University (also affiliated with the Institute of Multidisciplinary Research for Advanced Materials and the Institute for Materials Research) has achieved a projected spatial resolution of 7.4 nm, breaking the 10 nm barrier, in X-ray ptychography using 4.5 keV tender X-rays at beamline BL10U of the 3 GeV high-brilliance synchrotron radiation facility NanoTerasu.